Thermal analysis of A1GaN/GaN HEMT monolithic integration with CMOS on silicon <111> substrates

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Creator: 

Chyurlia, Pietro Natale Alessandro

Date: 

2007

Subject: 

Metal oxide semiconductors, Complementary.
Semiconductors -- Thermal properties -- Mathematical models.
Silicon-on-insulator technology.
Metal oxide semiconductor field-effect transistors.
Aluminum nitride.
Gallium nitride.
Microwave integrated circuits.

Language: 

English

Publisher: 

Carleton University

Identifier: 

Proquest Record
Library Catalogue Record
https://doi.org/10.22215/etd/2007-07607

Thesis Degree Name: 

Master of Applied Science: 
M.App.Sc.

Thesis Degree Level: 

Master's

Thesis Degree Discipline: 

Engineering, Electrical

Parent Collection: 

Theses and Dissertations

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