There is a growing interest in Integrated Injection Logic as a Large Scale Integration technology that may prove suitable for space environment applications. To investigate this possibility, a process was developed for the fabrication of minimum geometry Integrated Injection Logic at Carleton University.

This thesis presents an analytical approach to the design and performance characterization of the I2L devices. It outlines the development of a process for the fabrication of I2L devices and presents device characteristics, obtained from test circuits, that indicate both good performance and excellent agreement with the predictions of theory. Lastly, the radiation tests performed on the devices and their results are described. The tests indicate that in the present devices permanent damage effects are significant with total ionizing exposure dose on the order of 1 Mrad(Si) under normal operating conditions.