Fabrication and Characterization of Nanostructured Silicon Films for Photovoltaic Applications

It appears your Web browser is not configured to display PDF files. Download adobe Acrobat or click here to download the PDF file.

Click here to download the PDF file.

Creator: 

Wang, Kai

Date: 

2014

Abstract: 

In semiconductor solar cells, the energy band structure has a major influence on cell efficiency. Shifting the bandgap of the semiconductor to fit the solar radiation spectral will increase the energy conversion efficiency. One way to modify the bandgap is by nanostructuring the material. In this thesis, we introduce a novel nanostructured ITO substrate deposited with an ultrathin silicon film. The glancing angle deposition research group fabricated the ITO substrate at University of Alberta while the amorphous Si film was deposited at Carleton University. The sample was fabricated for
optical property study and photovoltaic performance evaluation.
An optical absorption and reflection characterization system was set up to measure the thin film semiconductor. The system was based on programmable optical equipment. The fabricated nanostructured Si/ITO film was characterized with this set up and the optical constants such as absorption coefficient and refractive index were extracted.

Subject: 

Optics
Materials Science

Language: 

English

Publisher: 

Carleton University

Thesis Degree Name: 

Master of Applied Science: 
M.App.Sc.

Thesis Degree Level: 

Master's

Thesis Degree Discipline: 

Engineering, Electrical and Computer

Parent Collection: 

Theses and Dissertations

Items in CURVE are protected by copyright, with all rights reserved, unless otherwise indicated. They are made available with permission from the author(s).