Reliability analysis of waferboard I-beams : a damage accululation approach

Creator: 

Gillard, Rodney Gerald

Date: 

1986

Abstract: 

Both the structural and serviceability reliability has been examined for waferboard I-beams and solid wood joists. The reliability indices of the two different joist types were compared to target reliability indices and to each other to attempt to ascertain the performance of the waferboard I-beams. The analysis was performed using both a first order - second moment approximation and a method incorporating a Monte-Carlo simulation and a Damage Accumulation model. The Damage Accumulation model was also used to evaluate present floor system testing procedures, particularily the CMHC testing procedure. An attempt was made to propose an alternate procedure, one which would result in a cost saving for the manufacturer and at the same time provide information as to the ultimate flexural capacity of the system to the engineering profession.

Subject: 

Wooden Beams
Reliability (Engineering)

Language: 

English

Publisher: 

Carleton University

Thesis Degree Name: 

Master of Engineering: 
M.Eng.

Thesis Degree Level: 

Master's

Thesis Degree Discipline: 

Engineering, Civil

Parent Collection: 

Theses and Dissertations

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