Reliability analysis of waferboard I-beams : a damage accululation approach
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Both the structural and serviceability reliability has been examined for waferboard I-beams and solid wood joists. The reliability indices of the two different joist types were compared to target reliability indices and to each other to attempt to ascertain the performance of the waferboard I-beams. The analysis was performed using both a first order - second moment approximation and a method incorporating a Monte-Carlo simulation and a Damage Accumulation model. The Damage Accumulation model was also used to evaluate present floor system testing procedures, particularily the CMHC testing procedure. An attempt was made to propose an alternate procedure, one which would result in a cost saving for the manufacturer and at the same time provide information as to the ultimate flexural capacity of the system to the engineering profession.
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This work is available on request. You can request a copy at https://library.carleton.ca/forms/request-pdf-copy-thesis
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Copyright © 1986 the author(s). Theses may be used for non-commercial research, educational, or related academic purposes only. Such uses include personal study, research, scholarship, and teaching. Theses may only be shared by linking to Carleton University Institutional Repository and no part may be used without proper attribution to the author. No part may be used for commercial purposes directly or indirectly via a for-profit platform; no adaptation or derivative works are permitted without consent from the copyright owner.
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- 1986
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